CHEN, J. .; YAN, L. .; WANG, S. .; ZHENG, W. . Deep Reinforcement Learning-Based Automatic Test Case Generation for Hardware Verification. Journal of Artificial Intelligence General science (JAIGS) ISSN:3006-4023, [S. l.], v. 6, n. 1, p. 409–429, 2024. DOI: 10.60087/jaigs.v6i1.267. Disponível em: https://ojs.boulibrary.com/index.php/JAIGS/article/view/267. Acesso em: 24 apr. 2025.