Chen, J. ., Yan, L. ., Wang, S. . and Zheng, W. . (2024) “Deep Reinforcement Learning-Based Automatic Test Case Generation for Hardware Verification”, Journal of Artificial Intelligence General science (JAIGS) ISSN:3006-4023, 6(1), pp. 409–429. doi: 10.60087/jaigs.v6i1.267.